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rev. 2.3 4/05 copyright ? 2005 by silicon laboratories si5320 si5320 sonet/sdh p recision c lock m ultiplier ic features applications description the si5320 is a precision clock multiplier designed to exceed the requirements of high-speed communication systems, incl uding oc-192/oc-48 and 10 gbe. this device phase locks to an input clock in the 19, 39, 78, 155, 311, or 622 mhz frequency range and generates a frequency- multiplied clock ou tput that can be configured for operation in the 19, 155, or 622 mhz range. silicon laboratories? dspll ? technology delivers all pll function ality with unparalleled performance while eliminating external loop filter components, providing programmable loop parameters, and simplifying design. fec rates are supported with selectable 255/ 238 or 238/255 scaling of the clock multiplication ratios. the si5320 establishes a new standard in performance and integration for ultra-low-jitter clock generation. it operates from a single 3.3 v supply. functional block diagram ? ultra-low-jitter cl ock output with jitter generation as low as 0.3 ps rms ? no external components (other than a resistor and standard bypassing) ? input clock ranges at 19, 39, 78, 155, 311, and 622 mhz ? output clock ranges at 19, 155, or 622 mhz ? digital hold for loss of input clock ? support for forward and reverse fec clock scaling ? selectable loop bandwidth ? loss-of-signal alarm output ? low power ? small size (9x9 mm) ? sonet/sdh line/port cards ? optical modules ? core switches ? digital cross connects ? terabit routers infrqsel[2:0] dspll t m frqsel[1:0] cl ko ut + cl ko ut ? 2 cal_actv 2 f ec[1:0] bw sel [1:0] 3 2 biasing & supply regulation rext vsel33 v d d gnd dh_act v signal detect calibration rst n/ cal 2 cl kin+ cl kin? valtime los fxddelay dbl bw ordering information: see page 29. si5320 si5320
si5320 2 rev. 2.3 n otes :
si5320 rev. 2.3 3 t able of c ontents section page 1. electrical specificat ions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4 2. functional description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .16 2.1. dspll? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 2.2. clock input and output rate selection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .16 2.3. pll performance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 2.4. digital hold of the pll . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 2.5. hitless reco very from digital hold . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .18 2.6. loss-of-signal alarm . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .18 2.7. reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 2.8. pll self-calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 2.9. bias generation circuitry . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .20 2.10. differential input ci rcuitry . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 2.11. differential output circuitry . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 2.12. power supply connections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 2.13. design and layout guid elines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 3. pin descriptions: si5320 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 4. ordering guide . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 5. package outline . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 6. 9x9 mm cbga card lay out . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 document change list . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32 contact information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .34
si5320 4 rev. 2.3 1. electrical specifications table 1. recommended operating conditions parameter symbol test condition min 1 typ max 1 unit ambient temperature t a ?20 2 25 85 c si5320 supply voltage 3 when using 3.3 v supply v dd33 3.135 3.3 3.465 v notes: 1. all minimum and maximum specifications are guaranteed and apply across the recommended operating conditions. typical values apply at nominal supply voltages and an operating temperature of 25 c unless otherwise stated. 2. the si5320 is guaranteed by design to o perate at ?40 c. all electrical specif ications are guaranteed for an ambient temperature of ?20 to 85 c. 3. the si5320 specifications are guarant eed when using the recommended application circuit (including component tolerance) of figure 5 on page 15. 3.3 v operation us es an on-chip voltage regulator and is recommended.
si5320 rev. 2.3 5 figure 1. clkin voltage characteristics figure 2. rise/fall time measurement figure 3. transitionless period on clkin for detecting a los condition note: w hen using single-ended clock sources, the unused clock input on the si5320 must be ac-coupled to ground. 0.5 v id clkin+ clkin? (clkin+) ? (clkin?) v id b. operation with differential clock input v is a. operation with single-ended clock input clkin+ clkin? note: transmission line termination, when required, must be provided externally. t f t r 80% 20% t los (c lkin+) ? (c lkin ?) 0 v
si5320 6 rev. 2.3 table 2. dc characteristics, v dd =3.3v (v dd33 =3.3v 5%, t a = ?20 to 85 c) parameter symbol test condition min typ max unit supply current 1 i dd clock in = 622.08 mhz clock out = 19.44 mhz ? 141 155 ma supply current 2 i dd clock in = 19.44 mhz clock out = 622.08 mhz ? 135 145 ma power dissipation using 3.3 v supply clock output p d clock in = 19.44 mhz clock out = 622.08 mhz ? 445 479 mw common mode input voltage 1,2,3 (clkin) v icm 1.0 1.5 2.0 v single-ended input voltage 2,3,4 (clkin) v is see figure 1a 200 ? 500 4 mv pp differential input voltage swing 2,3,4 (clkin) v id see figure 1b 200 ? 500 4 mv pp input impedance (clkin+, clkin?) r in ?80?k ? differential output voltage swing (clkout) v od 100 ? load line-to-line 816 906 1100 mv pp output common mode voltage (clkout) v ocm 100 ? load line-to-line 1.4 1.8 2.2 v output short to gnd (clkout) i sc(?) ?60 ? ? ma output short to v dd25 (clkout) i sc(+) ?15?ma input voltage low (lvttl inputs) v il ??0.8 v input voltage high (lvttl inputs) v ih 2.0 ? ? v input low current (lvttl inputs) i il ??50 a input high current (lvttl inputs) i ih ??50 a internal pulldowns (all lvttl inputs) i pd ??50 a input impedance (lvttl inputs) r in 50 ? ? k ? output voltage low (lvttl outputs) v ol i o =.5ma ? ? 0.4 v output voltage high (lvttl outputs) v oh i o =.5ma 2.0 ? ? v notes: 1. the si5320 device provides weak 1.5 v internal biasing that enables ac-coupled operation. 2. clock inputs may be driven differentially or single-endedly. w hen driven single-endedly, the unused input should be ac coupled to ground. 3. transmission line termination, when required, must be provided externally. 4. although the si5320 device can operate with input clock swings as high as 1500 mv pp , silicon laboratories recommends maintaining the input clock amplitude below 500 mv pp for optimal performance.
si5320 rev. 2.3 7 table 3. ac characteristics (v dd33 =3.3v 5%, t a = ?20 to 85 c) parameter symbol test condition min typ max unit input clock frequency (clkin) fec[1:0] = 00 (non fec) infrqsel[2:0] = 001 infrqsel[2:0] = 010 infrqsel[2:0] = 011 infrqsel[2:0] = 100 infrqsel[2:0] = 101 infrqsel[2:0] = 110 f clkin no fec scaling 19.436 38.872 77.744 155.48 310.97 621.95 ? ? ? ? ? ? 21.685 43.369 86.738 173.48 346.95 693.90 mhz input clock frequency (clkin) fec[1:0] = 01 (forward fec) infrqsel[2:0] = 001 infrqsel[2:0] = 010 infrqsel[2:0] = 011 infrqsel[2:0] = 100 infrqsel[2:0] = 101 infrqsel[2:0] = 110 f clkin 255/238 fec scaling 18.142 36.284 72.568 145.13 290.27 580.54 ? ? ? ? ? ? 20.239 40.478 80.955 161.91 323.82 647.64 mhz input clock frequency (clkin) fec[1:0] = 10 (reverse fec) infrqsel[2:0] = 001 infrqsel[2:0] = 010 infrqsel[2:0] = 011 infrqsel[2:0] = 100 infrqsel[2:0] = 101 infrqsel[2:0] = 110 f clkin 238/255 fec scaling 20.826 41.652 83.305 166.61 333.22 666.44 ? ? ? ? ? ? 23.234 46.465 92.934 185.87 371.74 743.47 mhz input clock rise time (clkin) t r figure 2 ? ? 11 ns input clock fall time (clkin) t f figure 2 ? ? 11 ns input clock duty cycle c duty_in 40 50 60 % clkout frequency range * frqsel[1:0] = 00 (no output) frqsel[1:0] = 01 frqsel[1:0] = 10 frqsel[1:0] = 11 f o_19 f o_155 f o_622 ? 19.436 155.48 621.95 ? ? ? ? ? 21.685 173.48 693.90 mhz clkout rise time t r figure 2; single-ended; after 3 cm of 50 ? fr4 stripline ? 213 260 ps clkout fall time t f figure 2; single-ended; after 3 cm of 50 ? fr4 stripline ? 191 260 ps output clock duty cycle c duty_out differential: (clkout+) ? (clkout?) 48 ? 52 % rstn/cal pulse width t rstn 20 ? ? ns *note: the si5320 provides a 1/32, 1/16, 1/8, 1/4, 1/2, 1, 2, 4, 8, 16, or 32x clock frequency multiplication function with an option for additional frequency scaling by a factor of 255/238 or 238/255 for fec rate compatibility.
si5320 8 rev. 2.3 transitionless period required on clkin for detecting a los condition. infrqsel[2:0] = 001 infrqsel[2:0] = 010 infrqsel[2:0] = 011 infrqsel[2:0] = 100 infrqsel[2:0] = 101 infrqsel[2:0] = 110 t los figure 3 24 / fo_622 16 / fo_622 12 / fo_622 10 / fo_622 9 / fo_622 9 / fo_622 ? ? ? ? ? ? 32 / fo_622 32 / fo_622 32 / fo_622 32 / fo_622 32 / fo_622 32 / fo_622 s recovery time for clearing an los condition valtime = 0 valtime = 1 t val measured from when a valid reference clock is applied until the los flag clears 0.09 12.0 ? ? 0.22 14.1 s table 3. ac characteristics (continued) (v dd33 =3.3v 5%, t a = ?20 to 85 c) parameter symbol test condition min typ max unit *note: the si5320 provides a 1/32, 1/16, 1/8, 1/4, 1/2, 1, 2, 4, 8, 16, or 32x clock frequency multiplication function with an option for additional frequency scaling by a factor of 255/238 or 238/255 for fec rate compatibility.
si5320 rev. 2.3 9 table 4. ac characteristics (pll performance characteristics) (v dd33 = 3.3 v 5%, ta = ?20 to 85 c) parameter symbol test condition min typ max unit wander/jitter at 800 hz bandwidth (bwsel[1:0] = 10 and dblbw = 0) jitter tolerance (see figure 7) j tol(pp) f=8hz 1000 ? ?ns f=80hz 100 ? ?ns f=800hz 10 ? ?ns clkout rms jitter generation fec[1:0] = 00 j gen(rms) 12 khz to 20 mhz ? 0.87 1.2 ps 50 khz to 80 mhz ? 0.26 0.35 ps clkout rms jitter generation fec[1:0 = 01, 10 j gen(rms) 12 khz to 20 mhz ? 0.85 1.2 ps 50 khz to 80 mhz ? 0.26 0.35 ps clkout peak-peak jitter generation fec[1:0 = 00 j gen(pp) 12 khz to 20 mhz ? 7.3 10.0 ps 50 khz to 80 mhz ? 3.7 5.0 ps clkout peak-peak jitter generation fec[1:0 = 01, 10 j gen(pp) 12 khz to 20 mhz ? 7.2 10.0 ps 50 khz to 80 mhz ? 3.8 5.0 ps jitter transfer bandwidth (see figure 6) f bw bw = 800 hz ? 800 ? hz wander/jitter transfer peaking j p < 800 hz ? 0.0 0.05 db wander/jitter at 1600 hz bandwidth (bwsel[1:0] = 10 and dblbw = 1) jitter tolerance (see figure 7) f = 16 hz 500 ? ? ns f=160hz 50 ? ? ns f=1600hz 5 ? ? ns clkout rms jitter generation fec[1:0] = 00 j gen(rms) 12 khz to 20 mhz ? 0.78 1.2 ps 50 khz to 80 mhz ? 0.25 0.35 ps clkout peak-peak jitter generation fec[1:0] = 00 j gen(pp) 12 khz to 20 mhz ? 7.0 9.0 ps 50 khz to 80 mhz ? 3.8 5.0 ps jitter transfer bandwidth (see figure 6) f bw bw = 1600 hz ? 1600 ? hz wander/jitter transfer peaking j p < 1600 hz ? 0.00 0.05 db notes: 1. higher pll bandwidth settings provide smaller clock output wander with temperature gradient. 2. for reliable device operation, temperature gradients should be limited to 10 c/min. 3. telcordia gr-1244-core requirements specify maximum phase tr ansient slope during clock rearrangement in terms of nanoseconds per millisecond. the equivalent ps/ s unit is used here since the maximum phase transient magnitude for the si5320 (tpt_mtie) never reaches one nanosecond.
si5320 10 rev. 2.3 wander/jitter at 1600 hz bandwidth (bwsel[1:0] = 01 and dblbw = 0) jitter tolerance (see figure 7) j tol(pp) f = 16 hz 1000 ? ? ns f = 160 hz 100 ? ? ns f = 1600 hz 10 ? ? ns clkout rms jitter generation fec[1:0] = 00 j gen(rms) 12 khz to 20 mhz ? 0.82 1.0 ps 50 khz to 80 mhz ? 0.26 0.35 ps clkout rms jitter generation fec[1:0] = 01, 10 j gen(rms) 12 khz to 20 mhz ? 0.79 1.0 ps 50 khz to 80 mhz ? 0.26 0.35 ps clkout peak-peak jitter generation fec[1:0] = 00 j gen(pp) 12 khz to 20 mhz ? 7.3 10.0 ps 50 khz to 80 mhz ? 3.8 5.0 ps clkout peak-peak jitter generation fec[1:0] = 01, 10 j gen(pp) 12 khz to 20 mhz ? 7.1 10.0 ps 50 khz to 80 mhz ? 4.3 5.0 ps jitter transfer bandwidth (see figure 10) f bw bw = 1600 hz ? 1600 ? hz wander/jitter transfer peaking j p < 1600 hz ? 0.0 0.1 db wander/jitter at 3200 hz bandwidth (bwsel[1:0] = 01 and dblbw = 1) jitter tolerance (see figure 7) f = 32 hz 500 ? ? ns f = 320 hz 50 ? ? ns f=3200 hz 5 ? ? ns clkout rms jitter generation fec[1:0] = 00 j gen(rms) 12 khz to 20 mhz ? 0.72 0.9 ps 50 khz to 80 mhz ? 0.24 0.3 ps table 4. ac characteristics (pll performance characteristics) (continued) (v dd33 = 3.3 v 5%, ta = ?20 to 85 c) parameter symbol test condition min typ max unit notes: 1. higher pll bandwidth settings provide smaller clock output wander with temperature gradient. 2. for reliable device operation, temperature gradients should be limited to 10 c/min. 3. telcordia gr-1244-core requirements specify maximum phase tr ansient slope during clock rearrangement in terms of nanoseconds per millisecond. the equivalent ps/ s unit is used here since the maximum phase transient magnitude for the si5320 (tpt_mtie) never reaches one nanosecond.
si5320 rev. 2.3 11 clkout peak-peak jitter generation fec[1:0] = 00 j gen(pp) 12 khz to 20 mhz ? 6.8 10.0 ps 50 khz to 80 mhz ? 3.7 5.0 ps jitter transfer bandwidth (see figure 6) f bw bw = 3200 hz ? 3200 ? hz wander/jitter transfer peaking j p < 3200 hz ? 0.05 0.1 db wander/jitter at 3200 hz bandwidth (bwsel[1:0] = 00 and dblbw = 0) jitter tolerance (see figure 7) j tol(pp) f=32hz 1000 ? ?ns f=320hz 100 ? ?ns f = 3200 hz 10 ? ?ns clkout rms jitter generation fec[1:0] = 00 j gen(rms) 12 khz to 20 mhz ? 0.86 1.2 ps 50 khz to 80 mhz ? 0.29 0.4 ps clkout rms jitter generation fec[1:0] = 01, 10 j gen(rms) 12 khz to 20 mhz ? 0.79 1.2 ps 50 khz to 80 mhz ? 0.28 0.4 ps clkout peak-peak jitter generation fec[1:0] = 00 j gen(pp) 12 khz to 20 mhz ? 7.7 10.0 ps 50 khz to 80 mhz ? 3.9 5.0 ps clkout peak-peak jitter generation fec[1:0] = 01, 10 j gen(pp) 12 khz to 20 mhz ? 7.2 10.0 ps 50 khz to 80 mhz ? 4.0 5.0 ps jitter transfer bandwidth (see figure 6) f bw bw = 3200 hz ? 3200 ?hz wander/jitter transfer peaking j p < 3200 hz ? 0.05 0.1 db wander/jitter at 6400 hz bandwidth (bwsel[1:0] = 00 and dblbw = 1) jitter tolerance (see figure 7) f = 64 hz 500 ? ? ns f=640hz 50 ? ? ns f=6400hz 5 ? ? ns clkout rms jitter generation fec[1:0] = 00 j gen(rms) 12 khz to 20 mhz ? 0.7 1.0 ps 50 khz to 80 mhz ? 0.25 0.3 ps clkout peak-peak jitter generation fec[1:0] = 00 j gen(pp) 12 khz to 20 mhz ? 6.6 9.0 ps 50 khz to 80 mhz ? 3.8 5.0 ps table 4. ac characteristics (pll performance characteristics) (continued) (v dd33 = 3.3 v 5%, ta = ?20 to 85 c) parameter symbol test condition min typ max unit notes: 1. higher pll bandwidth settings provide smaller clock output wander with temperature gradient. 2. for reliable device operation, temperature gradients should be limited to 10 c/min. 3. telcordia gr-1244-core requirements specify maximum phase tr ansient slope during clock rearrangement in terms of nanoseconds per millisecond. the equivalent ps/ s unit is used here since the maximum phase transient magnitude for the si5320 (tpt_mtie) never reaches one nanosecond.
si5320 12 rev. 2.3 jitter transfer bandwidth (see figure 6) f bw bw = 6400 hz ? 6400 ? hz wander/jitter transfer peaking j p < 6400 hz ? 0.05 0.1 db wander/jitter at 6400 hz bandwidth (bwsel[1:0] = 11 and dblbw = 0) jitter tolerance (see figure 7) (1/1 scaling) j tol(pp) f=64hz 1000 ? ?ns f=640hz 100 ? ?ns f=6400hz 10 ? ?ns clkout rms jitter generation fec[1:0] = 00 (1/1 scaling) j gen(rms) 12 khz to 20 mhz ? 1.0 1.4 ps 50 khz to 80 mhz ? 0.38 0.5 ps clkout rms jitter generation fec[1:0] = 01, 10 (255/238, 238/255 scaling) j gen(rms) 12 khz to 20 mhz ? 0.94 1.4 ps 50 khz to 80 mhz ? 0.41 0.6 ps clkout peak-peak jitter generation fec[1:0] = 00 (1/1 scaling) j gen(pp) 12 khz to 20 mhz ? 9.4 12.0 ps 50 khz to 80 mhz ? 4.7 5.5 ps clkout peak-peak jitter generation fec[1:0] = 01, 10 (255/238, 238/255 scaling) j gen(pp) 12 khz to 20 mhz ? 8.3 12.0 ps 50 khz to 80 mhz ? 4.6 5.5 ps jitter transfer bandwidth (see figure 6) f bw bw = 6400 hz ? 6400 ?hz wander/jitter transfer peaking j p < 6400 hz ? 0.05 0.1 db wander/jitter at 12800 hz bandwidth (bwsel[1:0] = 11 and dblbw = 1) jitter tolerance (see figure 7) f = 128 hz 500 ? ? ns f = 1280 hz 50 ? ? ns f = 12800 hz 5 ? ? ns clkout rms jitter generation fec[1:0] = 00 (1/1 scaling) j gen(rms) 12 khz to 20 mhz ? 0.74 1.0 ps 50 khz to 80 mhz ? 0.30 0.4 ps clkout peak-peak jitter generation fec[1:0] = 00 (1/1 scaling) j gen(pp) 12 khz to 20 mhz ? 6.9 9.0 ps 50 khz to 80 mhz ? 4.0 5.0 ps jitter transfer bandwidth (see figure 6) f bw bw = 12,800 hz ? 12800 ? hz wander/jitter transfer peaking j p < 12,800 hz ? 0.05 0.1 db table 4. ac characteristics (pll performance characteristics) (continued) (v dd33 = 3.3 v 5%, ta = ?20 to 85 c) parameter symbol test condition min typ max unit notes: 1. higher pll bandwidth settings provide smaller clock output wander with temperature gradient. 2. for reliable device operation, temperature gradients should be limited to 10 c/min. 3. telcordia gr-1244-core requirements specify maximum phase tr ansient slope during clock rearrangement in terms of nanoseconds per millisecond. the equivalent ps/ s unit is used here since the maximum phase transient magnitude for the si5320 (tpt_mtie) never reaches one nanosecond.
si5320 rev. 2.3 13 acquisition time t aq rstn/cal high to cal_actv low, with valid clock input and valtime = 0 ? 300 350 ms clock output wander with temperature gradient 1,2 c co_tg stable input clock; temperature gradient <10 c/min; 800 hz loop bw ? ? 50 ps/ c/ min initial frequency accuracy in digital hold mode (first 100 ms with supply voltage and tem- perature held constant) c dh_fa stable input clock selected until entering digital hold ? ? 10 ppm clock output frequency accuracy over temperature in digital hold mode c dh_t constant supply voltage ? 16.7 30 ppm / c clock output frequency accuracy over supply voltage in digital hold mode c dh_v33 constant temperature ? ? 250 ppm /v clock output phase step 3 (see figure 8) t pt_mtie when hitlessly recovering from digital hold mode 1/1 ? ?200 0 200 ps clock output phase step slope 3 (see figure 8) bwsel[1:0] = 11, fec[1:0] = 00, dblbw = 0 bwsel[1:0] = 00, fec[1:0] = 00, dblbw = 0 bwsel[1:0] = 01, fec[1:0] = 00, dblbw = 0 bwsel[1:0] = 10, fec[1:0] = 00, dblbw = 0 m pt when hitlessly recovering from digital hold mode 6400 hz, no scaling 3200 hz, no scaling 1600 hz, no scaling 800 hz, no scaling ? ? ? ? ? ? ? ? 10 5 2.5 1.25 ps/ s table 4. ac characteristics (pll performance characteristics) (continued) (v dd33 = 3.3 v 5%, ta = ?20 to 85 c) parameter symbol test condition min typ max unit notes: 1. higher pll bandwidth settings provide smaller clock output wander with temperature gradient. 2. for reliable device operation, temperature gradients should be limited to 10 c/min. 3. telcordia gr-1244-core requirements specify maximum phase tr ansient slope during clock rearrangement in terms of nanoseconds per millisecond. the equivalent ps/ s unit is used here since the maximum phase transient magnitude for the si5320 (tpt_mtie) never reaches one nanosecond.
si5320 14 rev. 2.3 figure 4. typical si5320 phase noise (clkin = 155.52 mhz, clkout = 622.08 mhz, and loop bw = 800 hz) table 5. absolute maximum ratings parameter symbol value unit 3.3 v dc supply voltage v dd33 ?0.5 to 3.6 v lvttl input voltage v dig ?0.3 to (v dd33 + 0.3) v maximum current any output pin 50 ma operating junction temperature t jct ?55 to 150 c storage temperature range t stg ?55 to 150 c esd hbm tolerance (100 pf, 1.5 k ? )1.0kv note: permanent device damage may occur if the above absolu te maximum ratings are exceeded. functional operation should be restricted to the conditions as specified in the operational sections of this data sheet. exposure to absolute maximum rating conditions for extended periods may affect device reliability. table 6. thermal characteristics parameter symbol test condition value unit thermal resistance junction to ambient ja still air 20 c/w 10 1 -160 -140 -120 -100 -80 -60 -40 -20 0 10 6 10 5 10 4 10 3 10 2 10 7 10 8 offset frequency phase noise (dbc/hz)
si5320 rev. 2.3 15 figure 5. si5320 typical application circuit (3.3 v supply) 10 k ? 1% los clkin+ valtime clkin- input clock source loss of signal (los) digital hold active los validation time dh_actv rstn/cal fec[1:0] bwsel[1:0] pll bandwidth select fec scaling select (14/15, 15/14) reset/calibration control cal_actv frqsel[1:0] clkout+ clkout? clock output (19, 155, or 622 mhz) clock output frequency select calibration active status output rext vsel33 vdd25 vdd33 gnd 0.1 f 3.3 v supply 2200 pf 22 pf si5320 infrqsel[2:0] input clock frequency select (19, 38, 77, 155, 311, or 622 mhz) 33 f fixed delay mode control fxddelay dblbw bandwidth doubling ferrite bead 0.1 f 0.1 f 100 ? 0.1 f 0.1 f
si5320 16 rev. 2.3 2. functional description the si5320 is a high-performance precision clock multiplication and clock generation device. this device accepts a clock input in the 19, 38, 77, 155, 311, or 622 mhz range, attenuates si gnificant amounts of jitter, and multiplies the input clock frequency to generate a clock output in the 19, 155, or 622 mhz range. additional optional scaling by a factor of either 255/238 (15/14) or 238/255 (14/15) is provided for compatibility with systems that provide or require clocks that are scaled for forward error correction (fec) rates. typical applications for the si5320 in sonet/sdh systems would be the generation and/or cleaning of 19.44, 155.52, or 622.08 mhz clocks from 19.44, 38.88, 77.76, 155.52, 311.04, or 622.08 mhz clock sources. the si5320 employs silicon laboratories dspll ? technology to provide excellent jitter performance while minimizing the external component count and maximizing flexibility and ea se-of-use. the si5320?s dspll phase locks to the input clock signal, attenuates jitter, and multiplies the clock frequency to generate the device?s sonet/sdh-compliant clock output. the dspll loop bandwidth is user -selectable, allowing the si5320?s jitter performance to be optimized for different applications. the si5320 can produce a clock output with jitter generation as low as 0.3 ps rms (see table 4), making the device an ideal solution for clock multiplication in sonet/sdh (including oc-48 and oc- 192) and gigabit ethernet systems. the si5320 monitors the clock input signal for loss-of- signal, and provides a loss-of-signal (los) alarm when missing pulses are detected. the si5320 provides a digital hold capability to co ntinue generation of a stable output clock when the input reference is lost. 2.1. dspll ? the si5320?s phase-locked loop (pll) uses silicon laboratories' dspll technology to eliminate jitter, noise, and the need for external loop filter components found in traditional pll implementations. this is achieved by using a digital signal processing (dsp) algorithm to replace the loop filter commonly found in analog pll designs. this algorithm processes the phase detector error term and generates a digital control value to adjust the frequency of the voltage- controlled oscillator (vco). the technology produces low phase noise clocks with less jitter than is generated using traditional methods. see figure 4 for an example phase noise plot. in addition, because external loop filter components are not required, sensitive noise entry points are eliminated, making the dspll less susceptible to board-level noise sources. this digital technology also allows for highly-stable and consistent operation over a ll process, temperature, and voltage variations. the benefits are smaller, lower power, cleaner, more reliable, and easier-to-use clock circuits. 2.1.1. selectable loop filter bandwidth the digital nature of the dspll loop filter allows control of the loop filter parameters without the need to change external components. the si5320 provides the user with up to eight user-selectable loop bandwidth settings for different system requirements. the base loop bandwidth is selected using the bwsel [1:0] along with dblbw = 0 pins. when dblbw is driven high, the bandwidth selected on the bwsel[1:0] pins is doubled. (see table 7.) when dblbw is asserted, the si5320 shows improved jitter generation performance. dblbw function is defined only when hitless recovery and fec scaling are disabled. therefore, when dblbw is high, the user must also drive fxddelay high and fec[1:0] to 00 for proper operation. 2.2. clock input and output rate selection the si5320 provides a 1/32x , 1/16x, 1/8x, 1/4x, 1/2x, 1x, 2x, 4x, 8x, 16x, or 32x clock frequency multiplication function with an option for additional frequency scaling by a factor of 255/238 or 238/255 for fec rate compatibility. output rates va ry in accordance with the input clock rate. the multiplic ation factor is configured by selecting the input and output clock frequency ranges for the device. the si5320 accepts an input clock in the 19, 38, 77, 155, 311, or 622 mhz frequency range. the input frequency range is selected using the infrqsel[2:0] pins. the infrqsel[2:0] settings and associated output clock rates are given in table 8. the si5320?s dspll phase locks to the clock input signal to generate an internal vco frequency that is a multiple of the input clock frequency. the internal vco frequency is divided down to produce a clock output in the 19, 155, or 622 mhz frequency range. the clock output range is selected using the frequency select (frqsel[1:0]) pins. the frqsel[1:0] settings and associated output clock ra tes are given in table 9. the si5320 clock input frequencies are variable within the range specified in table 3 on page 7. the output rates scale accordingly. wh en a 19.44 mhz input clock is used with no fec scaling enabled, the clock output frequency is 19.44, 155.52, or 622.08 mhz.
si5320 rev. 2.3 17 2.2.1. fec rate conversion the si5320 provides a 1/32x , 1/16x, 1/8x, 1/4x, 1/2x, 1x, 2x, 4x, 8x, 16x, or 32x clock frequency multiplication function with an option for additional frequency scaling by a factor of 255/238 or 238/255 for fec rate compatibility. the multiplicatio n factor is configured by selecting the input and output clock frequency ranges for the device. the additional frequency scaling by a factor of either 255/238 or 238/255 for fe c compatibility is selected using the fec[ 1:0] control inputs. (see table 10.) for example, a 622.08 mhz output clock (a non-fec rate) can be generated from a 19.44 mhz input clock (a non-fec rate) by setting infrqsel[2:0] = 001 (19.44 mhz range), setting frqsel [1:0] = 11 (32x multiplication), and sett ing fec[1:0] = 00 (no fec scaling). a 666.51 mhz output clock (a fec rate) can be generated from a 19.44 mhz input clock (a non-fec rate) by setting infrqsel[2:0] = 001 (19.44 mhz range), setting frqsel [1:0] = 11 (32x multiplication), and setting fec[1:0] = 01 (255/238 fec scaling). finally, a 622.08 mhz output clock (a non-fec rate) can be generated from a 20.83 mhz input clock (a fec rate) by setting infrqsel[2:0] = 001 (19.44 mhz range), setting frqsel [1:0] = 11 (32x multiplication), and setting fec[1:0] = 10 (238/255 fec scaling). 2.3. pll performance the si5320 pll is designed to provide extremely low jitter generation, high jitter tolerance, and a well- controlled jitter tran sfer function with low peaking and a high degree of jitter attenuation. 2.3.1. jitter generation jitter generation is defined as the amount of jitter produced at the output of the device with a jitter free input clock. generated jitter arises from sources within the vco and other pll components. jitter generation is also a function of the pll bandwidth setting. higher loop bandwidth settings ma y result in lower jitter generation, but may also result in less attenuation of jitter on the input clock signal. 2.3.2. jitter transfer jitter transfer is defined as the ratio of output signal jitter to input signal jitter for a sp ecified jitter fr equency. the jitter transfer characteristic determines the amount of input clock jitter that passes to the outputs. the dspll technology used in the si5320 provides tightly- controlled jitter transfer curves because the pll gain parameters are determined by digital circuits that do not vary over supply voltage, process, and temperature. in a system application, a we ll-controlled transfer curve table 7. loop bandwidth settings loop bandwidth bwsel1 bwsel0 dblbw * 12800 hz 1 1 1 6400 hz 1 1 0 6400 hz 0 0 1 3200 hz 0 0 0 3200 hz 0 1 1 1600 hz 0 1 0 1600 hz 1 0 1 800 hz 1 0 0 *note: when dblbw = 1, fxddelay must be asserted and fec scaling must be disabled. table 8. nominal clock input frequencies input clock frequency range infrqsel2 infrqsel1 infrqsel0 reserved111 622mhz110 311mhz101 155mhz 100 77mhz 011 38mhz 010 19mhz 001 reserved000 table 9. nominal clock output frequencies output clock frequency range frqsel1 frqsel0 622 mhz 1 1 155 mhz 1 0 19 mhz 0 1 driver powerdown 0 0 table 10. fec frequency scalings fec frequency scaling fec1 fec0 1/1 0 0 255/238 0 1 238/255 1 0 reserved 1 1
si5320 18 rev. 2.3 minimizes the output clock jitter variation from board to board, providing more consistent system level jitter performance. the jitter transfer characteristic is a function of the bwsel[1:0] setting. (see table 7.) lower bandwidth selection settings result in mo re jitter attenuation of the incoming clock but may result in higher jitter generation. table 4 on page 9 gives the 3 db bandwidth and peaking values for specified bwsel settings. figure 6 shows the jitter transfer curve mask. figure 6. pll jitter transfer mask/template 2.3.3. jitter tolerance jitter tolerance for the si5320 is defined as the maximum peak-to-peak sinusoidal jitter that can be present on the incoming clock. the tolerance is a function of the jitter frequency, because tolerance improves for lower input jitter frequency. see figure 7. figure 7. jitter tolerance mask/template 2.4. digital hold of the pll when no valid input clock is available, the si5320 digitally holds the internal os cillator to its last frequency value. this provides a stable clock to the system until an input clock is again valid. this clock maintains very stable operation in the presence of constant voltage and temperature. the frequency accuracy specifications for digital hold mode are given in table 4 on page 9. 2.5. hitless recove ry from digital hold when the si5320 device is locked to a valid input clock, a loss of the input clock causes the device to automatically switch to di gital hold mode. when the input clock signal returns, the device performs a ?hitless? transition from digital hold mode back to the selected input clock. that is, the device performs ?phase build-out? to absorb the phase difference between the internal vco clock operating in digital hold mode and the new/returned input clock. the maximum phase step size seen at the clock output during this transition and the maximum slope for this phase step are given in table 4 on page 9. this feature can be disabled by asserting the fxddelay pin. when the fxddelay pin is high, the output clock is phase and frequency locked with a known phase relationship to the input clock. consequently, any abrupt phase change on the input clock propagates through the device, and the output slews at the selected loop bandwidth until the original phase relationship is restored. note: when the dblbw is asserted, hitless recovery must also be disabled by driving fxddelay high for proper operation. figure 8. recovery from digital hold 2.6. loss-of-signal alarm the si5320 has loss-of-si gnal (los) circuitry that constantly monitors the clkin input clock for missing pulses. the los circuitry sets a los output alarm signal when missing pulses are detected. the los circuitry operates as follows. regardless of the selected input clock frequency range, the los circuitry divides down the input clock into the 19 mhz range. the los circuitry then over-samples this divided-down input clock to search for extended periods of time without input clock transitions. if the los jitter transfer 0 db f bw f jitter peaking ?20 db/dec. jitter out jitter in (s) input jitter amplitude 10 ns f bw ?20 db/dec. f jitter in excessive input jitter range recovery from digital hold m pt t pt_mtie
si5320 rev. 2.3 19 circuitry detects four consecutive samples of the divided-down input clock that are the same state (i.e., 1111 or 0000), a los condition is declared, the si5320 goes into digital hold mode, and the los output alarm signal is set high. the los sampling circuitry runs at a frequency of f o_622/8 , where f o_622 is the output clock frequency when the frqsel[1:0] pins are set to 11. table 3 on page 7 lists the minimum and maximum transitionless time periods required for declaring a los on the input clock (t los ). once the los alarm is asserted, it is held high until the input clock is validated over a time period designated by the valtime pin. when valt ime is low, the validation time period is about 100 ms. when valtime is high, the validation time period is about 13 s. if another los condition is detected on the input clock during the validation time (i.e., if another set of 1111 or 0000 samples are detected), the los alarm remains asserted, and the validation time starts over. when the los alarm is finally released, the si5320 exits digital hold mode and locks to the input clock. the los alarm is automatically set high at power-on and at every low- to-high transition of the rstn/cal pin. in these cases, the si5320 undergoes a self-calibration before releasing the los alarm and locking to the input clock. the si5320 also provides an output indicating the digital hold status of the device, dh_actv. the si5320 only enters the digital hold mode upon the loss of the input clock. when this occurs, the los alarm will also be active. therefore, applications that require monitoring of the status of the si5320 need only monitor the cal_actv and either the los or dh_actv outputs to know the state of the device. 2.7. reset the si5320 provides a reset/calibration pin, rstn/ cal, which resets the device and disables the outputs. when the rstn/cal pin is driven low, the internal circuitry enters into the reset mode, and all lvttl outputs are forced into a high-impedance state. also, the clkout+ and clkout? pins are forced to a nominal cml logic low and high respectively (see figure 9). this feature is useful for in-circuit test applications. a low-to-hig h transition on rstn/cal initializes all digital logi c to a known condition and initiates self-calibration of the dspll. upon completion of self-calibration, the dspll begins to lock to the clock input signal. figure 9. clkout equivalent circuit, rstn/ cal asserted low 2.8. pll self-calibration the si5320 achieves optimal jitter performance by using self-calibration circuitry to set the vco center frequency and loop gain parameters within the dspll. internal circuitry generates self calibration automatically on powerup or after a loss of power condition. self- calibration can also be manu ally initiated by a low-to- high transition on the rstn/cal input. a self-calibration should be initiated after changing the state of the fec[1:0] inputs. whether manually in itiated or automatic ally initiated at powerup, the self-calibration process requires the presence of a valid input clock. if the self-calibration is in itiated without a valid clock present, the device waits for a valid clock before completing the self-calibration. the si5320 clock output is set to the lower end of the operating frequency range while the device is waiting for a valid clock. after the clock input is validated, the calibration process runs to completion; the device locks to the clock input, and the clock output shifts to its target frequency. subsequent losses of the input clock signal do not require re- calibration. if the clock inpu t is lost following self- calibration, the device enters digital hold mode. when the input clock returns, the de vice re-locks to the input clock without performing a se lf-calibration. during the calibration process, the output clock frequency is indeterminate and may jump as high as 5% above the final locked value. 100 ? v dd 2.5 v 100 ? clkout? clkout+ 15 ma
si5320 20 rev. 2.3 2.9. bias generation circuitry the si5320 makes use of an external resistor to set internal bias currents. th e external resistor allows precise generation of bias currents which significantly reduces power consumption and variation as compared with traditional implementations that use an internal resistor. the bias generation circuitry requires a 10 k ? (1%) resistor connected between rext and gnd. 2.10. differential input circuitry the si5320 provides a differential input for the clock input, clkin. this input is in ternally biased to a voltage of v icm (see table 2 on page 6) and may be driven by a differential or single-ended dr iver circuit. for differential transmission lines, the termination resistor is connected externally as shown. 2.11. differential output circuitry the si5320 utilizes a curr ent mode logic (cml) architecture to drive the differential clock output, clkout. for single-ended output operation, simply connect to either clkout+ or clkout?, and leave the unused signal unconnected. 2.12. power supply connections the si5320 incorporates an on-chip voltage regulator. the voltage regulator requires an external compensation circuit of one resistor and one capacitor to ensure stability over all operating conditions. internally, the si5320 v dd33 pins are connected to the on-chip voltage regulator input, and the v dd33 pins also supply power to the device?s lvttl i/o circuitry. the v dd25 pins supply power to the core dspll circuitry and are also used for connection of the external compensation circuit. the regulator?s compensation circuit is in reality a resistor and a capacitor in series between the v dd25 node and ground. (see figure 5 on page 15.) typically, the resistor is incorporated into the capacitor?s equivalent series resistance (esr). the target rc time constant for this combination is 15 to 50 s. the capacitor used in the si5320 evaluation board is a 33 f tantalum capacitor with an esr of 0.8 ? . this gives an rc time constant of 26.4 s. the venkel part number, ta6r3tcr336kbr, is an example of a capacitor that meets these specs. to get optimal performance from the si5320 device, the power supply noise spectrum must comply with the plot in figure 10. this plot shows the power supply noise tolerance mask for the si5320. the customer should provide a 3.3 v supply that does not have noise density in excess of the amount shown in the diagram. however, the diagram cannot be used as spur criteria for a power supply that contains single tone noise. figure 10. power supply noise tolerance mask f v n ( hz) 2100 42 10 khz 500 khz 100 mhz
si5320 rev. 2.3 21 2.13. design and layout guidelines precision clock circuits are susceptible to board noise and emi. to take precautions against unacceptable levels of board noise and emi affecting performance of the si5320, consider the following: ? power the device from 3.3 v since the internal regulator provides at least 40 db of isolation to the v dd25 pins (which power the pll circuitry). ? use an isolated local plane to connect the v dd25 pins. avoid running signal tr aces over or below this plane without a ground plane in between. ? route all i/o traces between ground planes as much as possible ? maintain an input clock amplitude in the 200 mv pp to 500 mv pp differential range. ? excessive high-frequency harmonics of the input clock should be minimized. the use of filters on the input clock signal can be used to remove high- frequency harmonics.
si5320 22 rev. 2.3 3. pin descriptions: si5320 figure 11. si5320 pin configuration (bottom view) bottom view a b c d e f g h 1 7 865432 rstn/cal valtime frqsel[0] clkout+ clkout? frqsel[1] infrqsel[1] gnd gnd gnd gnd gnd gnd gnd infrqsel[0] gnd vdd25 vdd25 vdd25 vdd25 vdd25 los clkin? gnd vdd33 vdd33 vdd33 vdd25 vdd25 cal_actv clkin+ dblbw vdd33 vdd33 vdd33 vdd25 vdd25 dh_actv bw sel[1] vsel33 gnd gnd gnd gnd gnd rsvd_gnd bw sel[0] rsvd_gnd rsvd_gnd fxddelay rsvd_nc rsvd_gnd rsvd_gnd rsvd_nc fec[1] fec[0] rsvd_nc rsvd_nc rsvd_nc rsvd_nc rsvd_nc rext infrqsel[2]
si5320 rev. 2.3 23 figure 12. si5320 pin configuration (transparent top view) top view a b c d e f g h rstn/cal valtime frqsel[0] clkout+ clkout? frqsel[1] infrqsel[1] gnd gnd gnd gnd gnd gnd gnd infrqsel[0] gnd vdd25 vdd25 vdd25 vdd25 vdd25 los gnd vdd33 vdd33 vdd33 vdd25 vdd25 cal_actv clkin+ dblbw vdd33 vdd33 vdd33 vdd25 vdd25 dh_actv bwsel[1] vsel33 gnd gnd gnd gnd gnd rsvd_gnd bwsel[0] rsvd_gnd rsvd_gnd fxddelay rsvd_nc rsvd_gnd rsvd_gnd rsvd_nc fec[1] fec[0] rsvd_nc rsvd_nc rsvd_nc rsvd_nc rsvd_nc rext infrqsel[2] clkin? 178 6 5 4 3 2
si5320 24 rev. 2.3 table 11. si5320 pin descriptions pin # pin name i/o signal level description b4 fxddelay i* lvttl fixed delay mode. set high to disable hitless recovery from digital hold mode. this configuration is useful in applications that require a known, or constant, input-to-output phase relationship. when this pin is high, hitless switching from digital hold mode back to a valid clock input is disabled. when switching from digital hold mode to a valid clock input with fxddelay high, the clock output changes as necessary to re-establish the initial/ default input-to-output phas e relationship that is established after powerup or reset. the rate of change is determined by the setting of bwsel[1:0]. when this pin is low, hitless switching from digital hold mode back to a valid clock input is enabled. when switching from digital hold mode to a valid clock input with fxddelay low, the device enables "phase build out" to absorb the phase difference between the clock output and the clock input so that the phase change at the clock output is minimized. in this case, the input-to-output phase relationship following the transition out of digital hold mode is determined by the phase relationship at the time that switching occurs. note: fxddelay should remain at a static high or static low level during normal operation. transitions on this pin are allowed only when the rstn/cal pin is low. fxddelay must be set high when dblbw is set high. d1 e1 clkin+ clkin? i ac coupled 200?500 mv ppd (see table 2) system clock input. clock input to the dspll ci rcuitry. the frequency of the clkin signal is multiplied by the dspll to gen- erate the clkout clock output. the input-to-output frequency multiplicat ion factor is set by selecting the clock input range and the clock output range. the frequency of the clkin clock input can be in the 19, 38, 77, 155, 311, or 622 mhz range (nominally 19.44, 38.88, 77.76, 155.52, 311.04, or 622.08 mhz) as indicated in table 3 on page 7. the clock input frequency is selected using the infrqsel[2:0] pins. the clock output frequency is selected using the frqsel[1:0] pins. an additional scaling factor of either 255/238 or 238/255 may be selected for fec operation using the fec[1:0] con- trol pins. *note: the lvtll inputs on the si5320 device have an internal pull down mechanism that causes these inputs to default to a logic low state if the input is not driven from an external source.
si5320 rev. 2.3 25 f1 g1 h1 infrqsel[0] infrqsel[1] infrqsel[2] i* lvttl input frequency range select. pins(infrqsel[2:0]) select the frequency range for the input clock, clkin. (see table 3 on page 7.) 000 = reserved. 001 = 19 mhz range. 010 = 38 mhz range. 011 = 77 mhz range. 100 = 155 mhz range. 101 = 311 mhz range. 110 = 622 mhz range. 111 = reserved. f8 los o lvttl loss-of-signal (los) alarm for clkin. active high output indicates that the si5320 has detected missing pulses on the input clock signal. the los alarm is cleared after either 100 ms or 13 seconds of a valid clkin clock input, depending on the setting of the valtime input. d8 dh_actv o lvttl digital hold mode active. active high output indicates that the dspll is in digital hold mode. digital hold mode locks the current state of the dspll and forces the dspll to continue generation of the output clock with no additional phase or frequency information from the input clock. h3 rstn/cal i* lvttl reset/calibrate. when low, the internal circ uitry enters into the reset mode and all lvttl outputs are forced into a high- impedance state. also, the clkout+ and clkout? pins are forced to a nominal cml logic low and high respectively. this feature is useful for in-circuit te st applications. a low-to-high transition on rstn/cal initializes all digital logic to a known condition, enables the device outputs, and initia tes self-calibration of the dspll. upon completion of self-calibration, the dspll begins to lock to the selected clock input signal. table 11. si5320 pin descriptions (continued) pin # pin name i/o signal level description *note: the lvtll inputs on the si5320 device have an internal pull down mechanism that causes these inputs to default to a logic low state if the input is not driven from an external source.
si5320 26 rev. 2.3 h6 h7 clkout+ clkout? ocml differential clock output. high frequency clock output. the frequency of the clkout output is a multiple of the frequency of the clkin input. the input-to-o utput frequency multipli- cation factor is set by selecting the clock input range and the clock output range . the frequency of the clkout clock output can be in the 19, 155, or 622 mhz range as indicated in table 3 on page 7. the clock output frequency is selected using the frqsel[1:0] pins. the clock input frequency is selected using the infrqsel[2:0] pins. an addi- tional scaling factor of either 255/238 or 238/255 may be selected for fec operation using the fec[1:0] control pins. h5 h8 frqsel[0] frqsel[1] i* lvttl clock output frequency range select select frequency range of the clock output, clk- out. (see table 3 on page 7.) 00 = clock driver powerdown. 01 = 19 mhz frequency range. 10 = 155 mhz frequency range. 11 = 622 mhz frequency range. a3 a2 fec[0] fec[1] i* lvttl forward error correction (fec) selection. enable or disable scaling of the input-to-output fre- quency multiplication factor for fec clock rate com- patibility. the frequency of the clkout output is a multiple of the frequency of the clkin input. the input-to-out- put frequency multip lication factor is set by selecting the clock input range and the clock output range. the clock output frequency is selected using the frqsel[1:0] pins. the clock input frequency is selected using the infrqsel[2:0] pins. an addi- tional scaling factor of either 255/238 or 238/255 may be selected for fec operation using the fec[1:0] control pins as indicated below. 00 = no fec scaling. 01 = 255/238 fec scaling for all clock outputs. 10 = 238/255 fec scaling for all clock inputs. 11 = reserved. note: fec[1:0] must be set to 00 when dblbw is set high. table 11. si5320 pin descriptions (continued) pin # pin name i/o signal level description *note: the lvtll inputs on the si5320 device have an internal pull down mechanism that causes these inputs to default to a logic low state if the input is not driven from an external source.
si5320 rev. 2.3 27 b1 c1 bwsel[0] bwsel[1] i* lvttl bandwidth select. bwsel[1:0] pins set the band width of the loop filter within the dspll to 6400, 3200, 1600, or 800 hz as indicated below. 00 = 3200 hz 01 = 1600 hz 10 = 800 hz 11 = 6400 hz note: the loop filter bandwidth will be twice the value indicated when dblbw is set high. e8 cal_actv o lvttl calibration mode active. this output is driven high during the dspll self-cal- ibration and the subsequent initial lock acquisition period. h4 valtime i* lvttl clock validation time for los. valtime sets the clock validation times for recovery from an los alarm condition. when valtime is high, the validation time is approximately 13 seconds. when valtime is low, the validation time is approximately 100 ms. b2, b3, b6, b7, c8 rsvd_gnd ? lvttl reserved?gnd. this pin must be tied to gnd for normal operation. a4?8, b5, b8 rsvd_nc ? lvttl reserved?no connect. this pin must be left unconnected for normal operation. c2 vsel33 i* lvttl select 3.3 v v dd supply. this is an enable pin for the internal regulator. to enable the regulator, connect this pin to the v dd33 pins. d3?d5, e3?e5 v dd33 v dd supply 3.3 v supply. 3.3 v power is applied to the v dd33 pins. typical supply bypassing/decoupling for this configuration is indicated in the typical application diagram for 3.3 v supply operation. d6, d7, e6, e7, f3?f7 v dd25 v dd supply 2.5 v supply. these pins provide a means of connecting the compensation network for the on-chip regulator. table 11. si5320 pin descriptions (continued) pin # pin name i/o signal level description *note: the lvtll inputs on the si5320 device have an internal pull down mechanism that causes these inputs to default to a logic low state if the input is not driven from an external source.
si5320 28 rev. 2.3 c3?c7, e2, f2, g2?g8 gnd gnd supply ground. must be connected to system ground. minimize the ground path impedance for optimal performance of the device. h2 rext i analog external biasing resistor. used by on-chip circuitry to establish bias currents within the device. this pin must be connected to gnd through a 10 k ? (1%) resistor. d2 dblbw i* lvttl double bandwidth active high input to boos t the selected bandwidth 2x. when this pin is high, the loop filter bandwidth selected on bwsel[1:0] is doubled. when this pin is high, fxddelay must also be high and fec[1:0] must be 00. table 11. si5320 pin descriptions (continued) pin # pin name i/o signal level description *note: the lvtll inputs on the si5320 device have an internal pull down mechanism that causes these inputs to default to a logic low state if the input is not driven from an external source.
si5320 rev. 2.3 29 4. ordering guide part number package temperature SI5320-X-BC 63-ball cbga ?20 to 85 c note: ?x? denotes product revision.
si5320 30 rev. 2.3 5. package outline figure 13 illustrates the package details for the si5320. table 12 lists the valu es for the dimensions shown in the illustration. figure 13. 63-ball cerami c ball grid array (cbga) table 12. package drawing dimensions dimension description minimum nominal maximum a total package height 2.13 2.28 2.43 a1 standoff 0.60 0.70 0.80 a2 ceramic thickness 0.88 0.98 1.08 a3 mold cap thickness 0.55 0.60 0.65 b solder ball diameter 0.65 0.70 0.75 d ceramic body size 8.85 9.00 9.15 d1 mold cap size 8.55 8.75 8.95 e solder ball pitch 1.00 bsc s pitch to centerline 0.50 bsc
si5320 rev. 2.3 31 6. 9x9 mm cbga card layout table 13. recommended land pattern dimensions symbol parameter dimension notes min nom max c column width ? 7.00 ref ? d row height ? 7.00 ref ? e pad pitch ? 1.00 bsc ? f placement courtyard 10.00 ? ? 1 x pad diameter 0.64 0.68 0.72 2, 3 notes: 1. the placement courtyard is the minimum keep-out area required to assure assembly clearances. 2. pad diameter is copper defined (non-solder mask defined/nsmd). 3. osp surface finish recommended. 4. controlling dimension is millimeters. 5. land pad dimensions comply with ipc-sm-782 guidelines. 6. target solder paste volume per pad is 0.065 mm 3 0.010 mm 3 (4000 mils 3 600 mils 3 ). recommended stencil aperture dimensions to achieve target solder paste volume are 0.191 mm thick x 0.680.01 mm diameter, with a 0.025 mm taper. 7. recommended stencil type is chemically etched stai nless steel with circularly tapered apertures. placement courtyard
si5320 32 rev. 2.3 d ocument c hange l ist revision 2.0 to revision 2.1 ? updated figure 8, ?recovery from digital hold,? on page 18. ? updated figure 13, ?63-ball ceramic ball grid array (cbga),? on page 30. ? updated table 12, ?package diagram dimensions,? on page 30 ? added figure 4, ?typical si5320 phase noise (clkin = 155.52 mhz, clkout = 622.08 mhz, and loop bw = 800 hz),? on page 14 revision 2.1 to revision 2.2 ? updated "2.7. reset" on page 19. ? updated table 12, ?package diagram dimensions,? on page 30. revision 2.2 to revision 2.3 ? updated "5. package outline" on page 30.
si5320 rev. 2.3 33 n otes :
si5320 34 rev. 2.3 c ontact i nformation silicon laboratories inc. 4635 boston lane austin, tx 78735 tel: 1+(512) 416-8500 fax: 1+(512) 416-9669 toll free: 1+(877) 444-3032 email: product info@silabs.com internet: www.silabs.com silicon laboratories, silicon labs, and dspll are trade-marks of silicon laboratories inc. other products or brandnames mentioned herein are trademarks or registered trademarks of their respective holders. the information in this document is believed to be accurate in all respects at the time of publication but is subject to change without notice. silicon laboratories assumes no responsibility for errors and omissions, and disclaims responsib ility for any consequences resu lting from the use of information included herein. a dditionally, silicon laboratorie s assumes no responsibility for the functioning of und escribed features or parameters. silicon laboratories reserves the right to make changes without further notice . silicon laboratories makes no wa rranty, rep- resentation or guarantee regarding the suitability of its products for any particular purpose, nor does silicon laboratories as sume any liability arising out of the application or use of any product or circuit, and s pecifically disclaims any an d all liability, including wi thout limitation conse- quential or incidental damages. silicon laborat ories products are not designed, intended, or authorized for use in applications intended to support or sustain life, or for any other application in which the failure of the silicon laboratories product could create a s ituation where per- sonal injury or death may occur. should buyer purchase or us e silicon laboratories products for any such unintended or unauthor ized ap- plication, buyer shall indemnify and hold silicon laboratories harmless against all claims and damages.

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